IEC 60950-1 Fig NAF.2 Wedge Probe Jointed Accessibility Test Probe For Compliance Testing
Professionally designed for evaluating whether hazardous parts inside slot openings or enclosure gaps of electronic and information technology equipment can be accessed by users.
Product Overview
This precision safety testing probe fully complies with IEC 62368-1:2018 Clause 5.3.2, Clause 8.5.4.3, Annex V.1.5, Figure V.4, IEC 60950-1 Figure NAF.2 (S5366), Figure NAF.3 (S5370), as well as BS 60950 requirements.
Manufactured strictly according to the standard figure dimensions, the probe is widely used in:
- Information technology equipment testing
- Audio and video equipment testing
- Communication device safety testing
- Electrical enclosure accessibility verification
- Laboratory compliance testing
- Product certification evaluation
The probe adopts a durable nylon handle combined with a precision-machined probe structure, ensuring accurate accessibility testing and long service life.
Product Features
- Fully Compliant with IEC Standards: Designed according to IEC 62368-1 and IEC 60950 standard figures for accurate accessibility testing of slot openings and hazardous parts.
- Precision Manufactured Structure: The probe dimensions are manufactured strictly in accordance with international standard figures to ensure reliable compliance verification.
- Durable Nylon Handle: Ergonomic insulated nylon handle provides safe and comfortable operation during testing procedures.
- Reliable Accessibility Verification: Used to determine whether users can accidentally contact dangerous internal components through enclosure openings.
- Suitable for Multiple Electronic Products: Ideal for testing IT equipment, multimedia devices, communication products, and electrical appliances.
Technical Specifications
| Applied standard |
IEC 62368-1 |
| Applied clause |
5.3.2, V.1.5 and figure V.4 |
| Probe material |
Stainless steel |
| Applied Specimen |
Document/media Shredders |
Part of Dimension
The thickness of the probe varies linearly, with slope changes at the following points along the probe:
| Distance from probe tip, mm |
Probe thickness, mm |
| 0 |
2 |
| 12 |
4 |
| 180 |
24 |
Applications
This IEC 62368-1 test probe is widely used for:
- Information technology equipment safety testing
- Audio/video equipment compliance testing
- Communication product certification
- Electrical enclosure protection verification
- Consumer electronics safety evaluation
- Third-party laboratory testing
Typical products include:
- Servers and computers
- Power supplies
- Networking devices
- Multimedia equipment
- Telecom products
- Smart electronic devices
Frequently Asked Questions
Which standards does this accessibility test probe comply with?
The probe complies with IEC 62368-1:2018, IEC 60950-1 Figure NAF.2 and NAF.3, and BS 60950 requirements.
What is the main purpose of this probe?
It is used to determine whether hazardous internal parts inside slot openings or enclosure gaps can be touched by users.
What products can be tested?
The probe is mainly used for information technology equipment, multimedia products, communication devices, and other electronic equipment.
What material is used for the handle?
The handle is made of durable insulated nylon material for safe and comfortable operation.
Is the probe manufactured according to standard figures?
Yes. The probe dimensions and structure are strictly manufactured according to IEC standard figures.
Can customized probes be provided?
Yes. Customized accessibility probes and IEC testing equipment solutions can be provided according to customer requirements.
